Gas particle accumulator, treating and test apparatus

ABSTRACT

A particle accumulator display having a closed transparent chamber with a plurality of input nozzles to provide a vortex flow within the chamber. An ejection nozzle is centrally located within the chamat the same end as the inputozzles. A flow stabilizer is positioned between the input nozzles and the ejection nozzle. The flow stabilizer is spaced from the ejection nozzle to provide an annular channel adjacent the ejection nozzle. A tubular member communicates with the annular channel to permit material to be inserted into the closed chamber to treat the collected column for various tests. In a second embodiment, a second channel and accs tube is provided so that temp rature, pressurer other probes can be inserted into t chamber adjacent the collected column.

United States Patent [191 Klingler GAS PARTICLE, ACCUMULATOR, TREATING AND TEST APPARATUS Inventor: George A. Klingler, 300 Patterson Road, Dayton, Ohio 45419 Filed: Nov. 4, 1971 App]. No.: 195,551

References Cited UNITED STATES PATENTS 8/1933 Stull 55/419 X 1/1954 Loebel 55/419 UX 8/1965 Oehll'ich et al. 55/9 X June 19, 1973 Primary Examiner-Richard C. Queisser Assistant Examiner-Joseph W. Roskos Att0rney--Harry A. Herbert, Jr.

A particle accumulator display having a closed transparent chamber with a plurality of input nozzles to provide a vortex flow within the chamber. An ejection nozzle is centrally located within the chamat the same end as the inputozzles. A flow stabilizer is positioned between the input nozzles and the ejection nozzle. The flow stabilizer is spaced from the ejection nozzle to provide an annular channel adjacent the ejection nozzle. A tubular member communicates with the annular channel to permit material to be inserted into the closed chamber to treat the collected column for various tests. In a second embodiment, a second channel and accs tube is provided so that temp rature, pressurer other probes can be inserted into t chamber adjacent the collected column.

ABSTRACT 2 Claims, 3 Drawing Figures PATEN TED JUN 91975 SHEEIIUZ IN VENTOR. (a t I. ll

GAS PARTICLE ACCUMULATOR, TREATING AND TEST APPARATUS BACKGROUND OF THE INVENTION In apparatus for accumulating and displaying fine particles such as described in the inventors patent application, Apparatus for Accumulating and Displaying Fine Particles in a Gas, Ser. No. 157,136, it is sometimes desirable to treat the collected particles, for example, to determine if certain bacteria is present in the column of collected particles. Also, it may be desired to insert temperature or pressure probes into the region of the collected particles or to insert probes to remove samples of the collected particles. This must be accomplished without materially disturbing the vortex flow within the chamber.

BRIEF SUMMARY OF THE INVENTION According to this invention, one or more annular access channels are provided around the exit nozzle so that materials can be supplied to the annular swirl column or temperature, pressure or other type probes can be inserted into the swirl column within the chamber.

IN THE DRAWINGS FIG. 1 is an end view of a particle accumulator and display device according to the invention.

FIG. 2 is a sectional view of the device of FIG. 1 along the line 2-2.

FIG. 3 is a sectional view of a particle accumulator and display device according to another embodiment of the invention.

DETAILED DESCRIPTION OF THE INVENTION Reference is now made to FIG. 1 of the drawing, wherein a particle accumulator has a closed chamber 11, having a cylindrical member 12, closed at one end with a two part lid member 15. The lid member has a first portion 17 closing the end of chamber 1 l and a second portion 18 which acts as a tube support. The other end of chamber 11 is closed with a window member 20. The parts l2, l5 and 20 are held together by a frame member 22 having end members 24 and 25 held together by rods 27 and nuts 29 and 30. The chamber is sealed by conventional pressure seals 31 and 32. The end member 25 has an extension 33 adapted to be held in a support, not shown. Three tubes 34, 35, and 36 held by spacers 38 and 39, pass through holes in portions 17 and 18 of end member 15 and are formed into coils within chamber 11 as in the application referenced above. The tips of members 34, 35 and 36 are flattened to form exit slots for gas flow into chamber 11.

An ejection nozzle 42 is secured to gas output fixture 44 secured to members 17 and 18 and leading to gas output tube 46. A chamber 48 isformed around the nozzle 42 by a substantially cup shaped member 50 and a flow stabilizer member 51 joined at 52. A tubular member 53 is connected to chamber 48. An annular access channel 55 is thus provided between flow stabilizer member 51 and nozzle 42 so that material supplied to tube 53 can enter the chamber 11.

In the operation .of the device, either particle laden gas under pressure can be supplied to tubes 34, 35 and 36 or a particle laden gas source can be connected to tubes 34, 35 and 36 with a vacuum source being connected to output tube 46.

The pressure difference between input and output is determined by the particular gas and the particles to be separated. In one device built for separating dust particles in air, a pressure difference of only 6 inches of water was sufficient to provide separation. With heavier particles, such as metal particles, much higher pressure differences would be required.

A vortex flow is established within the chamber 11 to separate and provide an accumulated column of particles in the manner described in the application referenced above. Also, the column may be observed in the manner described in the application referenced above. To treat the column with dlifferent'materials to aid in the analysis of the particles in the column 60, a treating material may be supplied to the chamber through tube 53 into chamber 48 to be fed into chamber 11 through annular channel 55.

While only one annular channel is provided around ejection nozzle 42 in the device thus far described, additional channels may be provided as shown in FIG. 3. In this device, a substantially conical shaped member 62 is secured to member 50 and is positioned between the flow stabilizer member 51 and the nozzle 42 to provide a second channel 63. An access tube communicates with channel 63 so that pressure or temperature probes can be inserted into chamber 11. Also, this channel may be used to insert probes to remove samples of the collected particles. Additional channels could be provided where needed or additional tubes 65 may be provided around the chamber communicating with channels 63 and 55.

While a transparent chamber has been described, it may not be needed in all cases, for example where only the presence of particles need be determined, which can be determined by a change in pressure within the chamber, the chamber may be opaque. Also, pressure taps, not shown, may be provided for measuring the input and output pressures.

There is thus provided a particle separator and accumulator wherein materials for treating the material in the collected column can be supplied to the chamber and wherein temperature, pressure and other type probes can be inserted into the chamber.

I claim:

1. A particle accumulator and test apparatus, comprising: a closed transparent chamber; means, including a plurality of input nozzles, for providing a vortex flow of a particle laden gas within the chamber; a gas ejection nozzle spaced from and centrally located at the end of the chamber adjacent the input nozzles; means, positioned between the input nozzles and the ejection nozzle, for stabilizing the flow within the chamber to permit at least one annular column of particles to accumulate within said chamber; said flow stabilizing means having a substantially conical wall extending and spaced from said ejection nozzle; means, forming at least one annular chammel adjacent the ejection nozzle for providing access to said chamber whereby treatment and test material and apparatus may be inserted into said chamber; and means, passing through the wall of said chamber, for providing access to said annular channel; means, positioned between the conical wall of the flow stabilizer and the nozzle, for providing a plurality of annular access channels to saidfchamber; said means, passing through the wall of said chamber, including means for providing access to each of said annular access channels.

input nozzles and the ejection nozzle, adjacent the ejection nozzles, for providing access to said chamber whereby treatment and test materials, and test apparatus may be inserted into the particle column within said chamber and means, passing through the walls of said chamber for providing access to said annular channel. k 

1. A particle accumulator and test apparatus, comprising: a closed transparent chamber; means, including a plurality of input nozzles, for providing a vortex flow of a particle laden gas within the chamber; a gas ejection nozzle spaced from and centrally located at the end of the chamber adjacent the input nozzles; means, positioned between the input nozzles and the ejection nozzle, for stabilizing the flow within the chamber to permit at least one annular column of particles to accumulate within said chamber; said flow stabilizing means having a substantially conical wall extending and spaced from said ejection nozzle; means, forming at least one annular chammel adjacent the ejection nozzle for providing access to said chamber whereby treatment and test material and apparatus may be inserted into said chamber; and means, passing through the wall of said chamber, for providing access to said annular channel; means, positioned between the conical wall of the flow stabilizer and the nozzle, for providing a plurality of annular access channels to said chamber; said means, passing through the wall of said chamber, including means for providing access to each of said annular access channels.
 2. A particle accumulator channel test apparatus, comprising: a closed chamber; a gas ejection nozzle, positioned on the axis at one end of said chamber; means, including a plurality of input nozzles surrounding said ejection nozzle, for providing aT least one annular column of particles within said chamber; means forming at least one annular channel, between the input nozzles and the ejection nozzle, adjacent the ejection nozzles, for providing access to said chamber whereby treatment and test materials, and test apparatus may be inserted into the particle column within said chamber and means, passing through the walls of said chamber for providing access to said annular channel. 